It consists of the following instruments and functions. (1) Oscilloscope: Dual-trace waveform, Waveform addition, subtraction & multiplication, Lissajous Pattern, signal recording, digital filtering, AM/FM/PM demodulation, reverberation & speech intelligibility analysis. (2) Spectrum Analyzer: amplitude spectrum, octave analysis (1/1,1/3,1/6,1/12,1/24,1/48,1/96), frequency compensation, frequency weighting (A,B,C,ITU-R 468), peak hold, linear/exponential average, measurement of THD, THD+N, SNR, SINAD, Noise Level, IMD, Bandwidth, Crosstalk, peaks, harmonics, TD+N, DIM, Wow & Flutter, sound quality, phase spectrum, linear or circular auto/cross correlation, coherence function, transfer function, impulse response. Support 60 window functions & window overlap. (3) Signal Generator: function/multitone/arbitrary waveform/burst tone/MLS/DTMF/musical scale/white noise/pink noise generation, frequency/amplitude sweep, fade in/out, AM/FM/PM modulation. (4) Multimeter: voltmeter, sound pressure level meter(dB, dBA, dBB, dBC), frequency counter, RPM meter, counter, duty cycle meter, F/V converter, cycle mean/RMS, vibrometer. (5) Spectrum 3D Plot: waterfall and spectrogram, support both Short-Time Fourier Transform and Cumulative Spectral Decay. (6) Data Logger: long time data logging function for 226 derived variables, including RMS value, etc. Up to eight data logger windows can be opened and each window can trace up to 8 variables. (7) LCR meter: It is used to measure the value of an inductor, a capacitor or a resistor, or the impedance of a network of them. (8) Device Test Plan: It provides a mechanism for you to configure and conduct your own device test steps. It takes the advantage of the sound card's (or other ADC/DAC device's) capability of simultaneous input & output, to generate a stimulus to the Device Under Test (DUT) and acquire the response from that device at the same time. Different stimuli can be generated and the response can be analyzed in different ways.
What is new in this release:
Version 3.9:
- Added reverberation & speech intelligibility analysis (1/1 or 1/3 octave)
- Added discontinuity (abruptness) detection (for the detection of digital audio dropouts and speaker rub & buzz)
- Added Cumulative Spectrum Decay (CSD)
- Added ANSI / CEA-2010 Subwoofer Peak SPL Test
- Added Dynamic Intermodulation Distortion (DIM30, DIM100) Measurement
- Added Total Distortion + Noise (TD+N) Measurement
- Added Energy Time Curve
- Added Frequency Time Curve
What is new in version 3.8:
Version 3.8:
- Added inter-frame processing including linear and exponential average in DDP viewer.
- Added Jitter Measurement
- Added Impedance Analyzer Function
- Improved performance under ASIO driver
- Added Non Coherence Distortion Measurement
- Added GedLee Metric Measurement
- Added Trigger Frequency Rejection function for Sound Cards and NI DAQmx Cards
- Added a DDP Array Viewer
- Added Time Delay Removal under Oscilloscope Processing
- Added dedicated support for RTX6001 Audio Analyzer
- Added floating-point variables x1~x5 in Device Test Plan
What is new in version 3.7:
- Added demodulation (AM, FM, PM) option in Oscilloscope Processing.
- Added Remove DC and Half/Full Wave Rectification options in Oscilloscope Processing.
- Added Sound Loudness, Loudness Level and Sharpness measurement in Spectrum Analyzer Processing. Both free field and diffuse field are supported
- Added unweighted and weighted Wow & Flutter measurement in Spectrum Analyzer Processing.
- Added output modulation (AM, FM, PM) option in Signal Generator.
What is new in version 3.6:
New features include SINC interpolation in Oscilloscope, Synchronous frame average in Oscilloscope, Power Spectral Density function in Spectrum Analyzer, LabVIEW/LabWindow/CVI support, Serial Communication support in Device Test Plan, Multiple Instances on the same PC, Alarm sound configuration and acknowledgement, Reference curves as alarm limits, English unit system support in Vibrometer.
Requirements:
Windows compatible sound card
Limitations:
21-day trial
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